Gem Bids For Atomic Force Microscope (afm) , Nano Indenter , Micro Hardness Tester , X-ray Diffraction (xrd) , Optical Profiler , Confocal Microscope , Raman Microscope , Spectroscopic Ellipsometer , Fourier - Transform Infrared Spectroscopy( Ftir) , Energy Dispersive Spectrometry (edx) & Electron Backscattered Diffraction (ebsd) , Co-ordinate Measuring Machine (cmm) , Form Tester , Stereo Microscopy , Sample Preparation , Surface Roughness Tester (contact Type)
Supply Of Probes For Atomic Force Microscope
Annual Maintenance Contract Amc For Three Years For The Instrument Atomic Force Microscope Afm - Multi Mode 8 Afm Placed At The Central Sophisticated Instrumentation Facility Csif, University Of Calicut.
Supply Of High Resolution Atomic Force Microscope
Cecri03022025sts 000961-Atomic Force Microscope With Electrochemical Module And Other Accessories. See Chapter 4.2
supply of Cecri03022025sts 000961 - Electrochemical Atomic Force Microscope With Accessories. See Chapter 4.2
Supply of Atomic Force Microscope
Supply Of High Resolution Atomic Force Microscope
High-Resolution Atomic Force Microscope
CECRI03022025STS 000961 - ELECTROCHEMICAL ATOMIC FORCE MICROSCOPE WITH ACCESSORIES. SEE CHAPTER 4.2